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ATS
2000
IEEE
2000
IEEE
An adjacency-based test pattern generator for low power BIST design
Real-time Traffic| Added | 30 Jul 2010 |
| Updated | 30 Jul 2010 |
| Type | Conference |
| Year | 2000 |
| Where | ATS |
| Authors | Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch |
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