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ICCAD
2006
IEEE
14 years 4 months ago
2006
IEEE
Abstract—Manufacturing process variations lead to circuit timing variability and a corresponding timing yield loss. Traditional corner analysis consists of checking all process c...
ISSTA
2006
ACM
14 years 2 months ago
2006
ACM
Test campaigns usually require only a restricted subset of paths in a program to be thoroughly tested. As random testing (RT) offers interesting fault-detection capacities at low ...
CLOR
2006
13 years 11 months ago
2006
We present a new class of statistical models for part-based object recognition. These models are explicitly parametrized according to the degree of spatial structure that they can ...
GECCO
2006
Springer
13 years 11 months ago
2006
Springer
To help unravel the structure of the universe, astronomers have developed systems which observe large clusters of objects at the same time. One such system is the 2-degree field s...
EMNLP
2006
13 years 9 months ago
2006
We study unsupervised methods for learning refinements of the nonterminals in a treebank. Following Matsuzaki et al. (2005) and Prescher (2005), we may for example split NP withou...