1416 search results - page 161 / 284 » cost 2009 |
DATE
2009
IEEE
14 years 5 months ago
2009
IEEE
— An increasing number of hardware failures can be attributed to device reliability problems that cause partial system failure or shutdown. In this paper we propose a scheme for ...
DATE
2009
IEEE
14 years 5 months ago
2009
IEEE
— Technology scaling has caused the feature sizes to shrink continuously, whereas interconnects, unlike transistors, have not followed the same trend. Designing 3D stack architec...
DATE
2009
IEEE
14 years 5 months ago
2009
IEEE
As the number of cores continues to grow in both digital signal and general purpose processors, tools which perform automatic scheduling from model-based designs are of increasing...
DATE
2009
IEEE
14 years 5 months ago
2009
IEEE
—Localized heating-up creates thermal hotspots across the chip, with the integer register file ranked as the hottest unit in high-performance microprocessors. In this paper, we ...
DATE
2009
IEEE
2009
IEEE
Analyzing the impact of process variations on parametric measurements: Novel models and applications
14 years 5 months ago
Abstract—In this paper we propose a novel statistical framework to model the impact of process variations on semiconductor circuits through the use of process sensitive test stru...