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DAC
2008
ACM
14 years 10 months ago
2008
ACM
1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...
DAC
2008
ACM
14 years 10 months ago
2008
ACM
In deep submicron circuits, thermal hot spots and high temperature gradients increase the cooling costs, and degrade reliability and performance. In this paper, we propose a low-co...
DAC
2008
ACM
14 years 10 months ago
2008
ACM
A low power passive equalizer using RL terminator is proposed and optimized in this work. The equalizer includes an inductor in series with the resistive terminator, which boosts ...
DAC
2008
ACM
14 years 10 months ago
2008
ACM
C++ based verification methodologies are now emerging as the preferred method for SOC design. However most of the verification involving the C++ models are simulation based. The c...
DAC
2008
ACM
14 years 10 months ago
2008
ACM
This paper discusses the use of networks-on-chip (NoCs) consisting of multiple voltage-frequency islands to cope with power consumption, clock distribution and parameter variation...