The relative decline of single-threaded processor performance, coupled with the ongoing shift towards on chip parallelism requires that CAD applications run efficiently on paralle...
An effective technique to save power during scan based test is to switch off unused scan chains. The results obtained with this method strongly depend on the mapping of scan flip-...
Christian G. Zoellin, Hans-Joachim Wunderlich, Jen...
Concurrent interaction of multi-processor systems result in errors which are difficult to find. Traditional simulationbased verification techniques remove the concurrency informat...
: Spin-Torque Transfer Magnetic RAM (STT MRAM) is a promising candidate for future universal memory. It combines the desirable attributes of current memory technologies such as SRA...
Jing Li, Charles Augustine, Sayeef S. Salahuddin, ...
Achieving high performance under a peak temperature limit is a first-order concern for VLSI designers. This paper presents a new model of a thermally-managed system, where a stoch...