199 search results - page 13 / 40 » date 2000 |
DATE
2000
IEEE
13 years 11 months ago
2000
IEEE
We present a novel method for developing reconfigurable systems targeted at embedded system applications. We show how an existing object oriented design method (MOOSE) has been ad...
DATE
2000
IEEE
13 years 11 months ago
2000
IEEE
This paper describes an efficient error simulator able to analyze functional VHDL descriptions. The proposed simulation environment can be based on commercial VHDL simulators. Al...
DATE
2000
IEEE
13 years 11 months ago
2000
IEEE
An objective of DSP testing should be to ensure that any errors due to missed faults are infrequent compared to a circuit’s intrinsic errors, such as overflow. A method is prop...
DATE
2000
IEEE
13 years 11 months ago
2000
IEEE
We study the effectiveness of functional tests for full scan circuits. Functional tests are important for design validation, and they potentially have a high defect coverage indep...
DATE
2000
IEEE
13 years 11 months ago
2000
IEEE
This paper presents a new compaction algorithm to improve the yield of IC layout. The yield is improved by reducing the area where the faults are more likely to happen known as cr...