17 search results - page 4 / 4 » dft 2000 |
ITC
2000
IEEE
13 years 11 months ago
2000
IEEE
In this paper we present a design for IEEE 1149.1 Test Access Port (TAP)controllers that is based on a practical reuse methodology. While the basic use and core functionality of T...
VTS
2000
IEEE
13 years 11 months ago
2000
IEEE
A novel design-for-test (DFT) technique is presented for designing a core with a “virtual scan chain” which looks (to the system integrator) like it is shorter than the real s...