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DFT
2004
IEEE
102views VLSI» more  DFT 2004»
13 years 11 months ago
Exploiting an I-IP for In-Field SOC Test
Paolo Bernardi, Maurizio Rebaudengo, Matteo Sonza ...
ICCD
2004
IEEE
113views Hardware» more  ICCD 2004»
14 years 4 months ago
End-to-End Testability Analysis and DfT Insertion for Mixed-Signal Paths
Increasing system complexity and test cost demands new system-level solutions for mixed-signal systems. In this paper, we present a testability analysis and DfT insertion methodol...
Sule Ozev, Alex Orailoglu
DFT
2004
IEEE
92views VLSI» more  DFT 2004»
13 years 11 months ago
Reliability and Yield: A Joint Defect-Oriented Approach
We present a model for computing the probability of a parametric failure due to a spot defect. The analysis is based on electromigration in conductors under unidirectional current...
Roman Barsky, Israel A. Wagner
DFT
2004
IEEE
101views VLSI» more  DFT 2004»
13 years 11 months ago
Designs for Reducing Test Time of Distributed Small Embedded SRAMs
This paper proposes a test architecture aimed at reducing test time of distributed small embedded SRAMs (eSRAMs). This architecture improves the one proposed in [4, 5]. The improv...
Baosheng Wang, Yuejian Wu, André Ivanov
ICIP
2004
IEEE
14 years 9 months ago
A RST resilient object-based video watermarking scheme
In this paper, a blind object-based video watermarking scheme, which is robust to MPEG4 compression and normal video editing such as Rotation, Scaling or Translation (RST), is pro...
Dajun He, Qibin Sun