Optimizing the BIST configuration based on the characteristics of the design under test is a complicated and challenging work for test engineers. Since this problem has multiple o...
We present a pilot-assisted method for estimating the frequency selective channel in a MIMO-OFDM system. The pilot sequence is designed using the DFT of the Golay complementary se...
Tariq R. Qureshi, Michael D. Zoltowski, A. Robert ...
This paper proposes the directional filtering transform (dFT, in order to distinguish from the common usage on DFT) to better exploit intra-frame correlation in H.264 intra-frame ...
We propose a framework that allows dual-layer cooperative error control in a nanoscale network-on-chip (NoC), to simultaneously improve reliability, performance and energy efficie...
Pre-fabrication design verification and post-fabrication chip testing are two important stages in the product realization process. These two stages consume a large part of resourc...