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    DT
    2002
    56views more  DT 2002»
    High Defect Coverage with Low-Power Test Sequences in a BIST Environment
    15 years 3 months ago
    High Defect Coverage with Low-Power Test Sequences in a BIST Environment
    Download  www.iti.uni-stuttgart.de
    Patrick Girard, Christian Landrault, Serge Pravoss...
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    DT
    2002
    71views more  DT 2002»
    Embedded Software-Based Self-Test for Programmable Core-Based Designs
    15 years 3 months ago
    Embedded Software-Based Self-Test for Programmable Core-Based Designs
    Download  cadlab.ece.ucsb.edu
    Angela Krstic, Wei-Cheng Lai, Kwang-Ting Cheng, Li...
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    DT
    2002
    113views more  DT 2002»
    Image Processing Techniques for Wafer Defect Cluster Identification
    15 years 3 months ago
    Image Processing Techniques for Wafer Defect Cluster Identification
    Download  ethesys.yuntech.edu.tw
    Chenn-Jung Huang, Chua-Chin Wang, Chi-Feng Wu
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    DT
    1998
    40views more  DT 1998»
    Scheduling for Embedded Real-Time Systems
    15 years 3 months ago
    Scheduling for Embedded Real-Time Systems
    Download  www.cs.ucr.edu
    Felice Balarin, Luciano Lavagno, Praveen K. Murthy...
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    DT
    2007
    48views more  DT 2007»
    Chemical and Biological Applications of Digital-Microfluidic Devices
    15 years 4 months ago
    Chemical and Biological Applications of Digital-Microfluidic Devices
    Download  microfluidics.ee.duke.edu
    Richard B. Fair, Andrey Khlystov, Tina D. Tailor, ...
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