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ISPD
2007
ACM
151views Hardware» more  ISPD 2007»
13 years 11 months ago
Pattern sensitive placement for manufacturability
When VLSI technology scales toward 45nm, the lithography wavelength stays at 193nm. This large gap results in strong refractive effects in lithography. Consequently, it is a huge...
Shiyan Hu, Jiang Hu
DAGSTUHL
2001
13 years 11 months ago
Visualization for the Mind's Eye
Software visualization has been almost exclusively tackled from the visual point of view; this means visualization occurs exclusively through the visual channel. This approach has ...
Nelson A. Baloian, Wolfram Luther
CONSTRAINTS
2007
112views more  CONSTRAINTS 2007»
13 years 9 months ago
Maxx: Test Pattern Optimisation with Local Search Over an Extended Logic
In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
Francisco Azevedo
JODL
2006
136views more  JODL 2006»
13 years 9 months ago
MIT's CWSpace project: packaging metadata for archiving educational content in DSpace
This paper describes work in progress on the research project CWSpace, sponsored by the MIT and Microsoft Research iCampus program, to investigate the metadata standards and protoc...
William Reilly, Robert Wolfe, MacKenzie Smith
NETWORK
2008
139views more  NETWORK 2008»
13 years 9 months ago
Composing semantic services in open sensor-rich environments
Consider a scenario where Jane is at an airport. She wants to find a restaurant with healthy food and short waiting time on the way to her terminal. The airport can provide such s...
Jie Liu, Feng Zhao