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ET
2010
62views more  ET 2010»
15 years 16 days ago
RTL DFT Techniques to Enhance Defect Coverage for Functional Test Sequences
Hongxia Fang, Krishnendu Chakrabarty, Hideo Fujiwa...
BISE
2010
90views more  BISE 2010»
15 years 2 months ago
Letter to the Editor: Statements on the Contribution by Urbach et al. from Issue 4/2009
Hans Ulrich Buhl, Peter Mertens, Matthias Schumann...