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    RTL DFT Techniques to Enhance Defect Coverage for Functional Test Sequences

    13 years 10 months ago
    RTL DFT Techniques to Enhance Defect Coverage for Functional Test Sequences
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    Hongxia Fang, Krishnendu Chakrabarty, Hideo Fujiwa
    claim paper
    Added 25 Jan 2011
    Updated 25 Jan 2011
    Type Journal
    Year 2010
    Where ET
    Authors Hongxia Fang, Krishnendu Chakrabarty, Hideo Fujiwara
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