83 search results - page 11 / 17 » ic 2003 |
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
An in-circuit diagnostic test structure triggered by a light pulse captures logic states on-chip with picosecond timing accuracy, and the results read out via a scan chain thus pr...
ISPD
2003
ACM
14 years 2 months ago
2003
ACM
Design rules in advanced IC manufacturing processes are increasingly problematic for modern router architectures and algorithms. This paper first reviews types and causes of “d...
WWW
2003
ACM
14 years 10 months ago
2003
ACM
There are a number of recommendation systems that can suggest the webpages, within a single website, that other (purportedly similar) users have visited. By contrast, our goal is ...
GLVLSI
2003
IEEE
14 years 2 months ago
2003
IEEE
Decreasing feature sizes and increasing package densities are making thermal issues extremely important in IC design. Uneven thermal maps and hot spots in ICs cause physical stres...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
Faster defect localization is achieved by combining IC simulations and internal measurements. Time resolved photon emission records photons emitted during commutations (current) r...