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ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
–This paper provides proof of concept for the newly-approved 1149.6 standard by investigating the first silicon implementation of the test receiver. EXTEST and EXTEST_PULSE tests...
IOLTS
2003
IEEE
14 years 2 months ago
2003
IEEE
Fault tolerant design is a technique emerging in Integrated Circuits (IC’s) to deal with the increasing error susceptibility (Soft Errors, or Single Event Upsets, SEU) caused by...
ISQED
2003
IEEE
14 years 2 months ago
2003
IEEE
Approach Abstracts AltPSM Lithography Requirements for sub-100nm IC Design Domains Pradiptya Ghosh, Chung-shin Kang, Michael Sanie and David Pinto Numerical Technologies, 70 West P...
ISQED
2003
IEEE
14 years 2 months ago
2003
IEEE
An intermediate solution between conventional printed circuit board technology and wafer level packaging, WLP, is to fabricate interconnection circuits and flip chip assembly stru...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
Today’s low cost wireless phones have driven a need to be able to economically test high volumes of complex RF IC’s at a fraction of the cost of the IC. In June of 2001 the IB...