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ICCAD
1995
IEEE
13 years 11 months ago
1995
IEEE
Recently a deterministic built-in self-test scheme has been presented based on reseeding of multiple-polynomial linear feedback shift registers. This scheme encodes deterministic ...
ICCAD
1995
IEEE
13 years 11 months ago
1995
IEEE
This paper presents a linear time algorithm to reduce a large RC interconnect network into subnetworks which are approximated with lower order equivalent RC circuits. The number o...
ICCAD
1995
IEEE
13 years 11 months ago
1995
IEEE
—A problem in technology mapping is that the quality of the final implementation depends significantly on the initially provided circuit structure. This problem is critical, es...
ICCAD
1995
IEEE
13 years 11 months ago
1995
IEEE
Implementing a built-in self-test by a "test per clock" scheme offers advantages concerning fault coverage, detection of delay faults, and test application time. Such a ...
ICCAD
1995
IEEE
13 years 11 months ago
1995
IEEE
: A new approach to optimize multi-level logic circuits is introduced. Given a multi-level circuit, the synthesis method optimizes its area, simultaneously enhancing its random pat...