In many veri cation techniques fast functional evaluation of a Boolean network is needed. We investigate the idea of using Binary Decision Diagrams BDDs for functional simulatio...
We consider the problem of built-in test generation for synchronous sequential circuits. The proposed scheme leaves the circuit flip-flops unmodified, and thus allows at-speed ...
We present a new approach to the placement problem. The proposed approach consists of analyzing the input circuit and deciding on a two-dimensional global grid for that particular...
Traditional minimum area retiming algorithms attempt to achieve their prescribed objective with no regard to maintaining the initial state of the system. This issue is important f...
Maximum instantaneous power in VLSI circuits has a great impact on circuit's reliability and the design of power and ground lines. To synthesizehighlyreliablesystems,accurate...