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iccad 2003
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Static Verification of Test Vectors for IR Drop Failure
14 years 4 months ago
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Aman Kokrady, C. P. Ravikumar
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A Framework for Designing Reusable Analog Circuits
14 years 7 months ago
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Dean Liu, Stefanos Sidiropoulos, Mark Horowitz
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Dynamic Data-bit Memory Built-In Self- Repair
14 years 7 months ago
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Michael Nicolaidis, Nadir Achouri, Slimane Boutobz...
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Dynamic Platform Management for Configurable Platform-Based System-on-Chips
14 years 7 months ago
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Krishna Sekar, Kanishka Lahiri, Sujit Dey
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Adjustable Width Linear Combinational Scan Vector Decompression
14 years 4 months ago
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C. V. Krishna, Nur A. Touba
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