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ICCAD
2006
IEEE
14 years 6 months ago
2006
IEEE
With the continued scaling of CMOS technologies and reduced design margins, the reliability concerns induced by transient faults have become prominent. Moreover, the popular energ...
ICCAD
2006
IEEE
14 years 6 months ago
2006
IEEE
Abstract— Design variability due to within-die and die-todie process variations has the potential to significantly reduce the maximum operating frequency and the effective yield...
ICCAD
2006
IEEE
14 years 3 months ago
2006
IEEE
Dynamic power management (DPM) work proposed to date places inactive components into low power states using a single DPM policy. In contrast, we instead dynamically select among a...
ICCAD
2006
IEEE
14 years 6 months ago
2006
IEEE
— Methods for assembling crossbars from nanowires (NWs) have been designed and implemented. Methods for controlling individual NWs within a crossbar have also been proposed, but ...
ICCAD
2006
IEEE
14 years 6 months ago
2006
IEEE
Embedded systems are constrained by the available memory. Code compression techniques address this issue by reducing the code size of application programs. Dictionary-based code c...