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ICCAD
2006
IEEE
14 years 6 months ago
2006
IEEE
— Negative Bias Temperature Instability (NBTI) in PMOS transistors has become a significant reliability concern in present day digital circuit design. With continued scaling, th...
ICCAD
2006
IEEE
14 years 6 months ago
2006
IEEE
Reliable prediction of parametric yield for a specific design is difficult; a significant reason is the reliance of the yield estimation methods on the hard-to-measure distributio...
ICCAD
2006
IEEE
14 years 6 months ago
2006
IEEE
As CMOS technology scales into the nanometer regime, power dissipation and associated thermal concerns in high-performance ICs due to on-chip hot-spots and thermal gradients are b...
ICCAD
2006
IEEE
14 years 6 months ago
2006
IEEE
Abstract— Chip-package thermal analysis is necessary for the design and synthesis of reliable, high-performance, low-power, compact integrated circuits (ICs). Many methods of IC ...
ICCAD
2006
IEEE
14 years 6 months ago
2006
IEEE
– In real-time data-dominated communication and multimedia processing applications, due to the manipulation of large sets of data, a multi-layer memory hierarchy is used to enhan...