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ICCAD
2008
IEEE
14 years 5 months ago
2008
IEEE
— In today’s complex SoC designs, verification and debugging are becoming ever more crucial and increasingly timeconsuming tasks. The prevalence of embedded memories adds to t...
ICCAD
2008
IEEE
14 years 5 months ago
2008
IEEE
Abstract— Process variations make at-speed testing significantly more difficult. They cause subtle delay changes that are distributed rather than the localized nature of a trad...
ICCAD
2008
IEEE
14 years 5 months ago
2008
IEEE
—When manufacturing nano-devices, defects are a certainty and reliability becomes a critical issue. Until now, the most pervasive methods used to address reliability, involve inj...
ICCAD
2008
IEEE
14 years 5 months ago
2008
IEEE
Functional decomposition is a fundamental operation in logic synthesis. Prior BDD-based approaches to functional decomposition suffer from the memory explosion problem and do not...
ICCAD
2008
IEEE
14 years 5 months ago
2008
IEEE
In double patterning lithography (DPL) layout decomposition for 45nm and below process nodes, two features must be assigned opposite colors (corresponding to different exposures)...