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ICCAD
2008
IEEE
14 years 5 months ago
2008
IEEE
Abstract— Post-fabrication tuning provides a promising design approach to mitigate the performance and power overheads of process variation in advanced fabrication technologies. ...
ICCAD
2008
IEEE
14 years 5 months ago
2008
IEEE
—The microprocessor verification challenge becomes higher in the on-chip bus (OCB) than in the unit-level. Especially for the external interrupts, since they interface with othe...
ICCAD
2008
IEEE
14 years 5 months ago
2008
IEEE
— With process variation becoming a growing concern in deep submicron technologies, the ability to efficiently obtain an accurate estimate of failure probability of SRAM compone...
ICCAD
2008
IEEE
14 years 5 months ago
2008
IEEE
—To overcome the energy-efficiency limitations imposed by finite sub-threshold slope in CMOS transistors, this paper explores the design of integrated circuits based on nanoelect...
ICCAD
2008
IEEE
14 years 5 months ago
2008
IEEE
Abstract— This paper addresses the problem of solving finite word-length (bit-vector) arithmetic with applications to equivalence verification of arithmetic datapaths. Arithmet...