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VTS
2002
IEEE
14 years 17 days ago
2002
IEEE
Very Low Voltage (VLV) testing has been proposed to increase flaw detection in bulk silicon CMOS integrated circuits and this paper explores these and additional advantages in the...
KDD
2002
ACM
14 years 8 months ago
2002
ACM
This paper presents new methods for automatically integrating, summarizing and evaluating multimedia knowledge. These are essential for multimedia applications to efficiently and ...
ISCC
2002
IEEE
14 years 17 days ago
2002
IEEE
The competition on clients attention requires sites to update their content frequently. As a result, a large percentage of web pages are semi-dynamic, i.e., change quite often and...
ISQED
2002
IEEE
14 years 17 days ago
2002
IEEE
In this paper, we describe a comprehensive layout methodology for bonded three-dimensional integrated circuits (3D ICs). In bonded 3D integration technology, parts of a circuit ar...
RIDE
2002
IEEE
14 years 17 days ago
2002
IEEE
Internet marketplaces are now faced with new challenges that arise from the need to seamlessly integrate enormous number of product catalogs from different sources. In order to he...