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DATE
2010
IEEE
202views Hardware» more  DATE 2010»
15 years 9 months ago
FlashPower: A detailed power model for NAND flash memory
Abstract— Flash memory is widely used in consumer electronics products, such as cell-phones and music players, and is increasingly displacing hard disk drives as the primary stor...
Vidyabhushan Mohan, Sudhanva Gurumurthi, Mircea R....
DATE
2010
IEEE
180views Hardware» more  DATE 2010»
15 years 9 months ago
Reliability- and process variation-aware placement for FPGAs
Abstract—Negative bias temperature instability (NBTI) significantly affects nanoscale integrated circuit performance and reliability. The degradation in threshold voltage (Vth) d...
Assem A. M. Bsoul, Naraig Manjikian, Li Shang
DATE
2010
IEEE
121views Hardware» more  DATE 2010»
15 years 9 months ago
Properties of and improvements to time-domain dynamic thermal analysis algorithms
—Temperature has a strong influence on integrated circuit (IC) performance, power consumption, and reliability. However, accurate thermal analysis can impose high computation co...
Xi Chen, Robert P. Dick, Li Shang
DATE
2010
IEEE
185views Hardware» more  DATE 2010»
15 years 9 months ago
Fault diagnosis of analog circuits based on machine learning
— We discuss a fault diagnosis scheme for analog integrated circuits. Our approach is based on an assemblage of learning machines that are trained beforehand to guide us through ...
Ke Huang, Haralampos-G. D. Stratigopoulos, Salvado...
DATE
2010
IEEE
156views Hardware» more  DATE 2010»
15 years 9 months ago
Non-intrusive virtualization management using libvirt
—The success of server virtualization has let to the deployment of a huge number of virtual machines in today’s data centers, making a manual virtualization management very lab...
Matthias Bolte, Michael Sievers, Georg Birkenheuer...