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ISQED
2007
IEEE

143views Hardware» more ISQED 2007»

Assessing the Implications of Process Variations on Future Carbon Nanotube Bundle Interconnect Solutions

14 years 1 months ago

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Arthur Nieuwoudt, Yehia Massoud

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ISQED
2007
IEEE

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A DOE Set for Normalization-Based Extraction of Fill Impact on Capacitances

14 years 1 months ago

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Andrew B. Kahng, Rasit Onur Topaloglu

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ISQED
2007
IEEE

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A Test-Structure to Efficiently Study Threshold-Voltage Variation in Large MOSFET Arrays

14 years 1 months ago

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Nigel Drego, Anantha Chandrakasan, Duane S. Boning

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ISQED
2007
IEEE

135views Hardware» more ISQED 2007»

Design of a Window Comparator with Adaptive Error Threshold for Online Testing Applications

14 years 1 months ago

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Amit Laknaur, Rui Xiao, Sai Raghuram Durbha, Haibo...

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ISQED
2007
IEEE

109views Hardware» more ISQED 2007»

Variation Impact on SER of Combinational Circuits

14 years 1 months ago

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