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ISQED
2007
IEEE
14 years 1 months ago
2007
IEEE
In nanometer regime, the effects of variations are having an increasing impact on the delay and power characteristics of devices as well as the yield of the circuit. Statistical t...
ISQED
2007
IEEE
14 years 1 months ago
2007
IEEE
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
ISQED
2007
IEEE
14 years 1 months ago
2007
IEEE
For emerging deep-subwavelength lithography technologies (90 nm and following) the data volume and the complexity of Optical Proximity Correction (OPC) have increased dramatically...
ISQED
2007
IEEE
14 years 1 months ago
2007
IEEE
With the increasing size and sophistication of circuits and specifically in the presence of IP blocks, new wirelength estimation methods are needed in the design flow of large-sca...
ISQED
2007
IEEE
14 years 1 months ago
2007
IEEE
We propose gate level statistical simulation to bridge the gap between the most accurate Monte Carlo SPICE simulation and the most efficient circuit level statistical static timi...