Negative bias temperature instability (NBTI) has come to the forefront of critical reliability phenomena in advanced CMOS technology. In this paper, we propose a fast and accurate...
Hong Luo, Yu Wang 0002, Ku He, Rong Luo, Huazhong ...
In this paper, we propose a new approach to enforcing the passivity of a reduced system of general passive linear time invariant circuits. Instead of making the reduced models pas...
Boyuan Yan, Pu Liu, Sheldon X.-D. Tan, Bruce McGau...
Due to the roaring power dissipation and gaining popularity of 3D integration, thermal dissipation has been a critical concern of modern VLSI design. The availability for chip-lev...
Straining of silicon improves mobility of carriers resulting in speed enhancement for transistors in CMOS technology. Traditionally, silicon straining is applied in a similar ad-h...
We present a novel technique to exploit the power-performance tradeoff. The technique can be used stand-alone or in conjunction with dynamic voltage scaling, the mainstream techn...