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ITC
1991
IEEE
15 years 7 months ago
1991
IEEE
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ITC
1991
IEEE
15 years 7 months ago
1991
IEEE
126
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ITC
1991
IEEE
15 years 7 months ago
1991
IEEE
86
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ITC
1991
IEEE
15 years 7 months ago
1991
IEEE
120
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ITC
1991
IEEE
15 years 7 months ago
1991
IEEE
Two approaches have been used to balance the cost of generating e ective tests for ICs and the need to increase the ICs' quality level. The rst approach favorsusing high-leve...