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ITC
1993
IEEE
13 years 11 months ago
1993
IEEE
ITC
1993
IEEE
13 years 11 months ago
1993
IEEE
ITC
1993
IEEE
13 years 11 months ago
1993
IEEE
Built-In-Self-Test BIST for VLSI systems is desirable in order to reduce the cost per chip of production-time testing by the manufacturer. In addition, it can provide the means ...
ITC
1993
IEEE
13 years 11 months ago
1993
IEEE
This paper describes a technique which uses the Differential Non Linearity (DNL) test data for fault location and identification of the analog components of a flash ADC. In a flash...
ITC
1993
IEEE
13 years 11 months ago
1993
IEEE
This paper presents an efficient approach to generate tests for gate delay faults. Unlike other known algorithms which try to generate a 'good' delay test the presented ...