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ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
This paper presents an approach for reducing the test data volume that has to be stored in ATE vector memory for IC manufacturing testing. We exploit the capabilities of present A...
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
While the IEEE P1500 standards working group is on the verge of recommending a standard test interface for "non-mergeable" cores, a need was felt to adopt a standard met...
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
In this paper, we analyze failing circuits and propose a multiple-fault diagnosis approach. Our methodology has been validated experimentally and has proved to be highly efficient...
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
This paper describes a Hybrid DFT (H-DFT) architecture for low-cost, high quality structural testing in the high volume manufacturing (HVM) environment. This structure efficiently...
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
Test model generation is crucial in the test generation process of a high-performance design targeted for large volume production. A key process in test model generation requires ...