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106
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itc 2003
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Introduction to Applications and Industries for Microelectromechanical Systems (MEMS)
14 years 3 months ago
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Jeremy A. Walraven
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Testing High Frequency ADCs and DACs with a Low Frequency Analog Bus
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Stephen K. Sunter
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A Reconfigurable Power-Conscious Core Wrapper and its Application to SOC Test Scheduling
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Erik Larsson, Zebo Peng
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Structural Delay Testing of Latch-based High-speed Pipelines with Time Borrowing
14 years 3 months ago
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poisson.usc.edu
Kun Young Chung, Sandeep K. Gupta
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Application of Built in Self-Test for Interconnect Testing of FPGAs
14 years 3 months ago
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Dereck A. Fernandes, Ian G. Harris
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