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TCAD
2008
119views more  TCAD 2008»
13 years 9 months ago
Bridging Fault Test Method With Adaptive Power Management Awareness
Abstract--A key design constraint of circuits used in handheld devices is the power consumption, mainly due to battery life limitations. Adaptive power management (APM) techniques ...
S. Saqib Khursheed, Urban Ingelsson, Paul M. Rosin...
TCAD
2008
75views more  TCAD 2008»
13 years 9 months ago
An Efficient Graph-Based Algorithm for ESD Current Path Analysis
Abstract--The electrostatic discharge (ESD) problem has become a challenging reliability issue in nanometer-circuit design. High voltages that resulted from ESD might cause high cu...
Chih-Hung Liu, Hung-Yi Liu, Chung-Wei Lin, Szu-Jui...
TCAD
2008
119views more  TCAD 2008»
13 years 9 months ago
Full-Chip Routing Considering Double-Via Insertion
As the technology node advances into the nanometer era, via-open defects are one of the dominant failures due to the copper cladding process. To improve via yield and reliability, ...
Huang-Yu Chen, Mei-Fang Chiang, Yao-Wen Chang, Lum...
TCAD
2008
215views more  TCAD 2008»
13 years 9 months ago
Total Energy Minimization of Real-Time Tasks in an On-Chip Multiprocessor Using Dynamic Voltage Scaling Efficiency Metric
Abstract--This paper proposes an algorithm that provides both dynamic voltage scaling and power shutdown to minimize the total energy consumption of an application executed on an o...
Hyunjin Kim, Hyejeong Hong, Hong-Sik Kim, Jin-Ho A...
TCAD
2008
110views more  TCAD 2008»
13 years 8 months ago
A Reactive and Cycle-True IP Emulator for MPSoC Exploration
The design of MultiProcessor Systems-on-Chip (MPSoC) emphasizes intellectual-property (IP)-based communication-centric approaches. Therefore, for the optimization of the MPSoC inte...
Shankar Mahadevan, Federico Angiolini, Jens Spars&...