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TCAD
2008
13 years 9 months ago
2008
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
TCAD
2008
13 years 9 months ago
2008
Due to the increasing abstraction gap between the initial system model and a final implementation, the verification of the respective models against each other is a formidable task...
TCAD
2008
13 years 9 months ago
2008
Abstract--For modern embedded systems in the realm of highthroughput multimedia, imaging, and signal processing, the complexity of embedded applications has reached a point where t...
TCAD
2008
13 years 9 months ago
2008
We present an efficient optimization scheme for gate sizing in the presence of process variations. Our method is a worst-case design scheme, but it reduces the pessimism involved i...
TCAD
2008
13 years 9 months ago
2008
Abstract--Simplifying a combinational circuit while preserving its range has a variety of applications, such as combinational equivalence checking and random simulation. Previous a...