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EURODAC
1994
IEEE
130views VHDL» more  EURODAC 1994»
14 years 1 months ago
RESIST: a recursive test pattern generation algorithm for path delay faults
This paper presents Resist, a recursive test pattern generation (TPG) algorithm for path delay fault testing of scan-based circuits. In contrast to other approaches, it exploits t...
Karl Fuchs, Michael Pabst, Torsten Rössel
HICSS
1994
IEEE
149views Biometrics» more  HICSS 1994»
14 years 1 months ago
Stochastic Problem Solving by Local Computation Based on Self-Organization Paradigm
We are developing a new problem-solving methodology based on a self-organization paradigm. To realize our future goal of self-organizing computational systems, we have to study co...
Yasusi Kanada, Masao Hirokawa
ICCAD
1994
IEEE
109views Hardware» more  ICCAD 1994»
14 years 1 months ago
Efficient breadth-first manipulation of binary decision diagrams
We propose new techniques for efficient breadth-first iterative manipulation of ROBDDs. Breadth-first iterative ROBDD manipulation can potentially reduce the total elapsed time by...
Pranav Ashar, Matthew Cheong
ICCAD
1994
IEEE
61views Hardware» more  ICCAD 1994»
14 years 1 months ago
Simultaneous driver and wire sizing for performance and power optimization
In this paper, we study the simultaneousdriver and wire sizing (SDWS) problem under two objective functions: (i) delay minimization only, or (ii) combined delay and power dissipat...
Jason Cong, Cheng-Kok Koh
ICCAD
1994
IEEE
82views Hardware» more  ICCAD 1994»
14 years 1 months ago
Generating instruction sets and microarchitectures from applications
Abstract-- The design of application-specific instruction set processor (ASIP) system includes at least three interdependent tasks: microarchitecture design, instruction set design...
Ing-Jer Huang, Alvin M. Despain