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HASE
1998
IEEE
14 years 1 months ago
Estimating the Number of Residual Defects
Residual defects is one of the most important factors that allow one to decide if a piece of software is ready to be released. In theory, one can find all the defects and count th...
Yashwant K. Malaiya, Jason Denton
HICSS
1998
IEEE
120views Biometrics» more  HICSS 1998»
14 years 1 months ago
Load-Frequency Control Service in a Deregulated Environment
In a deregulated environment, independent generators and utility generators may or may not participate in the load-frequency control of the system. For the purpose of evaluating t...
A. P. Sakis Meliopoulos, George J. Cokkinides, A. ...
HICSS
1998
IEEE
112views Biometrics» more  HICSS 1998»
14 years 1 months ago
The Dynamics of Market Power with Deregulated Electricity Generation Supplies
Deregulated wholesale markets for bulk electricity supplies are likely to deviate from the perfectly competitive ideal in many areas where transmission losses, costs and capacity ...
Richard E. Schuler
HICSS
1998
IEEE
112views Biometrics» more  HICSS 1998»
14 years 1 months ago
AESOP: An Outline-Oriented Authoring System
Because a hypermedia document is more complex than conventional text, it requires preparation with respect to two key aspects. First, the author begins to develop a "vision&q...
Takeshi Shimizu, Stephen W. Smoliar, John S. Borec...
ICCAD
1998
IEEE
93views Hardware» more  ICCAD 1998»
14 years 1 months ago
Fast and exact simultaneous gate and wire sizing by Lagrangian relaxation
This paper considers simultaneous gate and wire sizing for general very large scale integrated (VLSI) circuits under the Elmore delay model. We present a fast and exact algorithm w...
Chung-Ping Chen, Chris C. N. Chu, D. F. Wong