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VTS
2007
IEEE
14 years 2 months ago
2007
IEEE
In SoC designs, limited test access to internal cores, lowcost external tester’s lack of accuracy and slow frequencies make application of at-speed tests impractical. Therefore,...
VTS
2007
IEEE
14 years 2 months ago
2007
IEEE
—As the complexity of the integrated circuits increases, they become more susceptible to manufacturing faults, decreasing the total process yield. Thus, it would be desirable to ...
VTS
2007
IEEE
14 years 2 months ago
2007
IEEE
Soft errors due to cosmic particles are a growing reliability threat for VLSI systems. In this paper we analyze the soft error vulnerability of FPGAs used in storage systems. Sinc...
ICCAD
2007
IEEE
14 years 5 months ago
2007
IEEE
Several technologies with sub-lithographic features are targeting the fabrication of crossbar memories in which the nanowire decoder is playing a major role. In this paper, we sug...
AVSS
2007
IEEE
14 years 2 months ago
2007
IEEE
Face localization using neural network is presented in this communication. Neural network was trained with two different kinds of feature parameters vectors; Zernike moments and E...