In SoC designs, limited test access to internal cores, lowcost external tester’s lack of accuracy and slow frequencies make application of at-speed tests impractical. Therefore,...
—As the complexity of the integrated circuits increases, they become more susceptible to manufacturing faults, decreasing the total process yield. Thus, it would be desirable to ...
Nima Honarmand, A. Shahabi, Hasan Sohofi, Maghsoud...
Soft errors due to cosmic particles are a growing reliability threat for VLSI systems. In this paper we analyze the soft error vulnerability of FPGAs used in storage systems. Sinc...
Brian Mullins, Hossein Asadi, Mehdi Baradaran Taho...
Several technologies with sub-lithographic features are targeting the fabrication of crossbar memories in which the nanowire decoder is playing a major role. In this paper, we sug...
M. Haykel Ben Jamaa, Kirsten E. Moselund, David At...
Face localization using neural network is presented in this communication. Neural network was trained with two different kinds of feature parameters vectors; Zernike moments and E...
Mohammed Saaidia, Anis Chaari, Sylvie Lelandais, V...