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    TCAD
    1998
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    Diagnosis of clustered faults and wafer testing
    14 years 8 days ago
    Diagnosis of clustered faults and wafer testing
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    —A probabilistic diagnosis algorithm is presented for constant degree structures. The performance of the algorithm is analyzed under a negative binomial failure distribution to a...
    Kaiyuan Huang, Vinod K. Agarwal, Krishnaiyan Thula...
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