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130
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TCAD
1998
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TCAD 1998
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Diagnosis of clustered faults and wafer testing
15 years 4 months ago
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—A probabilistic diagnosis algorithm is presented for constant degree structures. The performance of the algorithm is analyzed under a negative binomial failure distribution to a...
Kaiyuan Huang, Vinod K. Agarwal, Krishnaiyan Thula...
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