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    DATE
    2008
    IEEE
    86views Hardware» more  DATE 2008»
    Test Scheduling for Wafer-Level Test-During-Burn-In of Core-Based SoCs
    14 years 9 months ago
    Test Scheduling for Wafer-Level Test-During-Burn-In of Core-Based SoCs
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    Abstract—Wafer-level test during burn-in (WLTBI) has recently emerged as a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, the testi...
    Sudarshan Bahukudumbi, Krishnendu Chakrabarty, Ric...
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