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    2005
    IEEE
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    Projection-based performance modeling for inter/intra-die variations
    14 years 8 months ago
    Projection-based performance modeling for inter/intra-die variations
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    Large-scale process fluctuations in nano-scale IC technologies suggest applying high-order (e.g., quadratic) response surface models to capture the circuit performance variations....
    Xin Li, Jiayong Le, Lawrence T. Pileggi, Andrzej J...
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