DATE
2000
IEEE
13 years 12 months ago
2000
IEEE
In this paper, a new built-in self-test structure to test the static specifications of analog to digital converters (ADCs) is presented. A ramp signal generated by an integrator ...
ETS
2006
IEEE
14 years 1 months ago
2006
IEEE
In this paper, complex mixed signal circuits such as SiP or SOC including several ADCs and DACs are considered. A new DFT technique is proposed allowing the test of this complete ...
GLOBECOM
2009
IEEE
14 years 2 months ago
2009
IEEE
—In [1], we have proposed a novel cross-layer scheme based on resolution adaptive ADCs and fountain codes for the OFDM systems to lower the power consumption in ADCs. The simulat...