DATE
2010
IEEE
14 years 3 months ago
2010
IEEE
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...
ECCV
2004
Springer
14 years 4 months ago
2004
Springer
3D reconstruction from image data is required in many medical procedures. Recently, the use of fluoroscopy data to generate these 3D models has been explored. Most existing methods...