ESA
2000
Springer
14 years 3 months ago
2000
Springer
Several algorithms for computing the Minkowski sum of two polygons in the plane begin by decomposing each polygon into convex subpolygons. We examine different methods for decompo...
ESA
1998
Springer
14 years 3 months ago
1998
Springer
Abstract. Data sets in large applications are often too massive to t completely inside the computer's internal memory. The resulting input output communication or I O between ...
DIALM
2000
ACM
14 years 3 months ago
2000
ACM
This paper presents an efficient collision resolution protocol and its variations for the tag identification problem, where an electromagnetic reader attempts to obtain within its...
DIALM
2000
ACM
14 years 3 months ago
2000
ACM
COCO
2000
Springer
14 years 3 months ago
2000
Springer
We consider the problem of testing whether the intersection of a collection of k automata is empty. The straightforward algorithm for solving this problem runs in time k where is...
CIAC
2000
Springer
14 years 3 months ago
2000
Springer
We present an efficient algorithm for the approximate median selection problem. The algorithm works in-place; it is fast and easy to implement. For a large array it returns, with ...
FUN
2010
Springer
14 years 3 months ago
2010
Springer
We introduce a new number system that supports increments with a constant number of digit changes. We also give a simple method that extends any number system supporting increments...
CIAC
2003
Springer
14 years 3 months ago
2003
Springer
We study vehicle routing problems with constraints on the distance traveled by each vehicle or on the number of vehicles. The objective is to minimize the total distance traveled b...
ASIAN
2003
Springer
14 years 3 months ago
2003
Springer
Abstract. We provide a formal definition of information flows in XML transformations and, more generally, in the presence of type driven computations and describe a sound technique...
ASPDAC
2001
ACM
14 years 3 months ago
2001
ACM
Loical defect diagnosis is a critical yet challenging process in VLSI manufacturing. It involves the identification of the defect spots in a logic IC that fails testing. In the la...