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DATE
2005
IEEE
107views Hardware» more  DATE 2005»
14 years 5 months ago
Test Planning for Mixed-Signal SOCs with Wrapped Analog Cores
Many SOCs today contain both digital and analog embedded cores. Even though the test cost for such mixed-signal SOCs is significantly higher than that for digital SOCs, most prio...
Anuja Sehgal, Fang Liu, Sule Ozev, Krishnendu Chak...