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29
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DATE
2005
IEEE
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DATE 2005
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Test Planning for Mixed-Signal SOCs with Wrapped Analog Cores
14 years 5 months ago
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people.ee.duke.edu
Many SOCs today contain both digital and analog embedded cores. Even though the test cost for such mixed-signal SOCs is significantly higher than that for digital SOCs, most prio...
Anuja Sehgal, Fang Liu, Sule Ozev, Krishnendu Chak...
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