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ATS
2010
IEEE
261views Hardware» more  ATS 2010»
13 years 9 months ago
The Test Ability of an Adaptive Pulse Wave for ADC Testing
In the conventional ADC production test method, a high-quality analogue sine wave is applied to the Analogue-toDigital Converter (ADC), which is expensive to generate. Nowadays, an...
Xiaoqin Sheng, Hans G. Kerkhoff