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30
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DFT
2002
IEEE
103
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VLSI
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DFT 2002
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Duplication-Based Concurrent Error Detection in Asynchronous Circuits: Shortcomings and Remedies
14 years 4 months ago
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www.eng.yale.edu
Concurrent error detection (CED) methods are typically employed to provide an indication of the operational health of synchronous circuits during normal functionality. Existing CE...
Thomas Verdel, Yiorgos Makris
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