ATS
2010
IEEE
13 years 8 months ago
2010
IEEE
In recent technology nodes, reliability is considered a part of the standard design flow at all levels of embedded system design. While techniques that use only low-level models at...
ATS
2010
IEEE
13 years 10 months ago
2010
IEEE
Systems with many integrated circuits (ICs), often of the same type, are increasingly common to meet the constant performance demand. However, systems in recent semiconductor techn...
ATS
2010
IEEE
13 years 12 months ago
2010
IEEE
ATS
2010
IEEE
13 years 12 months ago
2010
IEEE
One of the most challenging problems in post-silicon validation is to identify those errors that cause prohibitive extra delay on speedpaths in the circuit under debug (CUD) and o...
ATS
2010
IEEE
13 years 12 months ago
2010
IEEE
In the conventional ADC production test method, a high-quality analogue sine wave is applied to the Analogue-toDigital Converter (ADC), which is expensive to generate. Nowadays, an...
ATS
2010
IEEE
13 years 12 months ago
2010
IEEE
Abstract--To achieve a high product quality for nano-scale systems both realistic defect mechanisms and process variations must be taken into account. While existing approaches for...