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    ICCAD
    2003
    IEEE
    152views Hardware» more  ICCAD 2003»
    Dynamic Fault-Tolerance and Metrics for Battery Powered, Failure-Prone Systems
    15 years 4 days ago
    Dynamic Fault-Tolerance and Metrics for Battery Powered, Failure-Prone Systems
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    Emerging VLSI technologies and platforms are giving rise to systems with inherently high potential for runtime failure. Such failures range from intermittent electrical and mechan...
    Phillip Stanley-Marbell, Diana Marculescu
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