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DFT
2006
IEEE
148views VLSI» more  DFT 2006»
14 years 23 days ago
Bilateral Testing of Nano-scale Fault-tolerant Circuits
As the technology enters the nano dimension, the inherent unreliability of nanoelectronics is making fault-tolerant architectures increasingly necessary in building nano systems. ...
Lei Fang, Michael S. Hsiao