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33
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DFT
2009
IEEE
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VLSI
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DFT 2009
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Soft Core Embedded Processor Based Built-In Self-Test of FPGAs
14 years 6 months ago
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www.eng.auburn.edu
This paper presents the first implementation of Built-In Self-Test (BIST) of Field Programmable Gate Arrays (FPGAs) using a soft core embedded processor for reconfiguration of the...
Bradley F. Dutton, Charles E. Stroud
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