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28
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DATE
2010
IEEE
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DATE 2010
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Proactive NBTI mitigation for busy functional units in out-of-order microprocessors
14 years 24 days ago
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www.cs.pitt.edu
Due to fast technology scaling, negative bias temperature instability (NBTI) has become a major reliability concern in designing modern integrated circuits. In this paper, we prese...
Lin Li, Youtao Zhang, Jun Yang 0002, Jianhua Zhao
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